Refraction contrast imaging with a scanning microlens
نویسندگان
چکیده
We demonstrate subwavelength spatial resolution with a scanning microlens operating in collection mode with a large-area detector. Optical contrast is created by refraction of off-axis light rays at angles larger than the maximum collection angle. With a microfabricated silicon microlens 10 mm in diameter, we measure spatial resolution due to refraction contrast of l/4.3 at a wavelength of l510.7 mm. A model based on ray tracing is developed to explain our result, and we show that lens diameter and index of refraction limit resolution for large emission and collection angles. © 2001 American Institute of Physics. @DOI: 10.1063/1.1377318#
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تاریخ انتشار 2001